Omicron Variable Temperature (VT) Ultra High Vacuum (UHV) Scanning Probe Microscope (SPM)

Scanning probe microscopy (SPM) covers several related technologies for imaging and measuring surfaces on a fine scale, down to the level of molecules and groups of atoms. Omicron VT UHV SPM system is equipped with state-of-the-art STM, STM spectroscopy, beam deflection contact and non-contact AFM capabilities as well as EFM, SKPM and MFM. The measurements are done in the ultra high vacuum conditions with the pressure as low as 10^-10 mbar. The sample temperature can be controlled using LHe cryostat, radiative and direct heating, between 25K and 1500K.

Technical data

•          Matrix control system
•          Three modes of operation:
-         Contact mode AFM
-         Non-contact mode AFM
-         STM
These modes provide force/distance and current/voltage spectroscopy measurements. The STM mode provides an atom manipulation facility.
•          Scan (and offset) range X/Y/Z: 10μm x 10μm x 1.2μm
•          Coarse movement X/Y/Z: 10mm x 10mm x 10mm; Step size: 40nm – 500nm
•          Z-resolution: 0.1Ǻ
•          Measurements with atomic resolution
•          Vibration isolation: Internal eddy current dumping
•          Tunneling current: < 1pA – 300nA
•          Gap voltage: ±5mV to ±10V; applied to tip/cantilever, sample grounded
•          Ultra High Vacuum (UHV) chamber: 10-9-10-11mbar
•          Working temperature range: 25K - 750K; with LHe or LN2 cryostat
•         Sample heating in preparation stage through direct or radiative methods up to 1000K