Omicron UHV VT AFM/STM, model B002645 SPM PROBE VT AFM 25



Omicron Variable Temperature (VT) Ultra High Vacuum (UHV) Scanning Probe Microscope (SPM)

Scanning probe microscopy (SPM) covers several related technologies for imaging and measuring surfaces on a fine scale, down to the level of molecules and groups of atoms. Omicron VT UHV SPM system is equipped with state-of-the-art STM, STM spectroscopy, beam deflection contact and non-contact AFM capabilities as well as EFM, SKPM and MFM. The measurements are done in the ultra high vacuum conditions with the pressure as low as 10^-10 mbar. The sample temperature can be controlled using LHe cryostat, radiative and direct heating, between 25K and 1500K.


Technical data

•          Matrix control system
•          Three modes of operation:
-         Contact mode AFM
-         Non-contact mode AFM
-         STM
These modes provide force/distance and current/voltage spectroscopy measurements. The STM mode provides an atom manipulation facility.
•          Scan (and offset) range X/Y/Z: 10μm x 10μm x 1.2μm
•          Coarse movement X/Y/Z: 10mm x 10mm x 10mm; Step size: 40nm – 500nm
•          Z-resolution: 0.1Ǻ
•          Measurements with atomic resolution
•          Vibration isolation: Internal eddy current dumping
•          Tunneling current: < 1pA – 300nA
•          Gap voltage: ±5mV to ±10V; applied to tip/cantilever, sample grounded
•          Ultra High Vacuum (UHV) chamber: 10-9-10-11mbar
•          Working temperature range: 25K - 750K; with LHe or LN2 cryostat
•         Sample heating in preparation stage through direct or radiative methods up to 1000K




Contact Us

Address: Institute of Physics,Pregrevica 118, Belgrade 11080 (Zemun) Serbia
Telephone:+381 11 3713190
FAX:+381 11 3160531